Wednesday, November 1, 2006
Wednesday, February 1, 2006
Wednesday, December 14, 2005
Optimally-cooled chip operation can be a very effective and practical “knob” for controlling the increasing power dissipation and subsequent thermal problems in high-end integrated circuits (ICs), including microprocessors fabricated using nanometer scale CMOS technologies, according to a group of researchers at the University of California, Santa Barbara and Intel Corporation.
The details of the findings were reported at the 2005 IEEE International Electron Devices...
Thursday, December 1, 2005
Cool Chips: Cooling is one way to boost chip performance, but is there an optimum temperature beyond which further cooling yields diminishing returns? What is the best balance between IC cooling and power consumption? University of California-Santa Barbara researchers will present a comprehensive analysis for various nanometer-scale bulk CMOS and SOI technologies. Some conclusions: SOI-based devices are more responsive to cooling; the benefits of cooling increase as technology scales;...
Monday, November 14, 2005
Navin Srivastava, PhD candidate at the University of California at Santa Barbara, presented research on "realistic" RLC (resistance, inductance, capacitance) modeling of carbon nanotubes. Realizing these models is a first step toward building CAD tools for such devices, he said.
Previous modeling efforts,...
Tuesday, October 25, 2005
UCSB-Stanford Collaboration Earns Outstanding Paper Award at the 2005 VLSI/ULSI Multilevel Interconnection Conference
Ongoing collaboration between Kaustav Banerjee, an associate professor of electrical and computer engineering at the University of California, Santa Barbara, and Kenneth E. Goodson, an associate professor of mechanical engineering at Stanford University has been recognized through the Outstanding Graduate Student...
Tuesday, October 4, 2005
Kaustav Banerjee, an associate professor of electrical and computer engineering at the University of California, Santa Barbara won the 2005 international research award competition sponsored by the Electrostatic Discharge Association (ESDA).
The annual competition selects one outstanding researcher from academic institutes around the world in the field of electrostatic discharge (ESD). ESD is the single largest cause of all integrated circuit failures in the electronics industry...
Tuesday, March 22, 2005