Characterization Facilities

ESB Main Cleanroom

 

Materials Research Lab

Transmission electron microscopes:
FEI Titan FEG High Resolution TEM/STEM and Analytical Microscope
FEI Tecnai G2 Sphera Microscope for Life Science Studies

FEI Tecnai G2 Sphera Microscope w/EDS for Materials Science Studies

Scanning electron microscopes:
FEI XL40 Sirion FEG microscope w/EDS System
FEI XL30 Sirion FEG microscope
FEI Inspect S System w/CL System (coming) 
Scanning probe microscopes (STM/AFM):
Digital Instruments Multi-mode Nanoscope (2)
Digital Instruments Dimension 3000 microscope
Digital Instruments Dimension 3100 microscope
Asylum MFP-3D SL System
Asylum MFP-3D Bio System
Secondary Ion Mass Spectrometry System:
Physical Electronics 6650 Quadrupole 
X-ray Photoelectron Spectroscopy System:
Kratos Axis Ultra w/UPS Capability 
Focused Ion Beam Systems:
FEI Focused Ion Beam (Model DB235 Dual Beam) w/EDS System
FEI Focused Ion Beam (Helios 600 Dual Beam) w/Omniprobe
Electron microscopy simulation:
Software for Scanning Electron Microscopy (SEM)
Software for Transmission Electron Microscopy (TEM)