We have highlighted an underlying physical concept behind the BTBT process that has been mostly overlooked in literature. It has been shown that ignoring the dual nature of electrons and holes during the BTBT phenomenon can not only lead to substantially erroneous results but also to misleading...
ESB Main Cleanroom
- FEI Sirion Ultra High Resolution Field-Emission SEM w/EDX
- Veeco Dimension 3100 Nanoman AFM
- Hitachi s2400 Scanning Electron Microscope
- Veeco Multimode Scanning Probe Microscope
- Various Optical Inspection Microscopes (5)
- Rudolph Auto-EL Ellipsometer
- Filmetrics White Light Reflection Dielectric Characterization Tool
- Nanometrics 210 Reflectometer
- Dektak IIA Profilometer
- Probe Station with Curve Tracer
- Tencor Flexus 2320 Film Stress Measurement System
- Dektak VI Profilometer
Materials Research Lab
- Transmission electron microscopes:
- FEI Titan FEG High Resolution TEM/STEM and Analytical Microscope
- FEI Tecnai G2 Sphera Microscope for Life Science Studies
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FEI Tecnai G2 Sphera Microscope w/EDS for Materials Science Studies
- Scanning electron microscopes:
- FEI XL40 Sirion FEG microscope w/EDS System
- FEI XL30 Sirion FEG microscope
- FEI Inspect S System w/CL System (coming)
- Scanning probe microscopes (STM/AFM):
- Digital Instruments Multi-mode Nanoscope (2)
- Digital Instruments Dimension 3000 microscope
- Digital Instruments Dimension 3100 microscope
- Asylum MFP-3D SL System
- Asylum MFP-3D Bio System
- Secondary Ion Mass Spectrometry System:
- Physical Electronics 6650 Quadrupole
- X-ray Photoelectron Spectroscopy System:
- Kratos Axis Ultra w/UPS Capability
- Focused Ion Beam Systems:
- FEI Focused Ion Beam (Model DB235 Dual Beam) w/EDS System
- FEI Focused Ion Beam (Helios 600 Dual Beam) w/Omniprobe
- Electron microscopy simulation:
- Software for Scanning Electron Microscopy (SEM)
- Software for Transmission Electron Microscopy (TEM)