Jone F. Chen received the B.S. degree in electrical engineering from the National Cheng Kung University, Tainan, Taiwan, in 1990, and the M.S. and Ph.D. degrees in electrical engineering from the University of California, Berkeley, in 1995 and 1998, respectively. Since 1999, he has been with the Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University where he is currently a Professor. His main field of research includes the reliability of nanometer scale and high-voltage MOS devices. Jone was a visiting professor in the Nanoelectronics Research Lab at UCSB for one year (Sept 2010 to Aug 2011) working with Professor Kaustav Banerjee on emerging variability and reliability issues in nanoscale devices.